10.46243/jst.2020.v5.i4.pp199-207 registered

In the realm of Very Large Scale Integration (VLSI) circuit design, power efficiency has emerged as a paramount concern, particularly in the development of low-power electronic devices. This review paper delves into the efficacy of power gating techniques as a pivotal strategy to mitigate power consumption in VLSI circuits. We commence by elucidating the fundamental challenges associated with power consumption in VLSI circuits and introduce power gating as a viable solution. The paper systematically synthesizes existing literature, offering a comprehensive historical overview of power-saving methodologies in VLSI, with a specific focus on various power gating techniques. We critically analyze these techniques against key performance metrics such as leakage current reduction, delay, and area overhead, providing a comparative perspective. The review extends to recent advancements and innovative approaches in the field, highlighting their practical applications and effectiveness. Furthermore, we discuss the challenges and limitations inherent in current power gating designs, offering insights into potential areas for future research. This paper aims to serve as a resource for researchers and practitioners in the field of VLSI design, offering a detailed understanding of the current state of power gating techniques and their role in advancing low-power VLSI circuitry.